Comparisons of model size and complexity. FLOPs: the number of
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Comparisons of model size and complexity. FLOPs: the number of
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Interface trap density of Si/BOX of the control and hardened SOI wafers.
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Comparisons of model size and complexity. FLOPs: the number of
![Comparisons of model size and complexity. FLOPs: the number of](https://www.researchgate.net/publication/259510573/figure/fig7/AS:382574749863936@1468224336066/Band-diagram-of-Si-BOX-interface-showing-charged-acceptor-traps.png)
Band diagram of Si/BOX interface showing charged acceptor traps.
![Comparisons of model size and complexity. FLOPs: the number of](https://www.researchgate.net/profile/Huixiang-Huang-2/publication/259510573/figure/fig4/AS:382574745669638@1468224335879/Interface-trap-density-of-Si-BOX-of-the-control-and-hardened-SOI-wafers_Q320.jpg)
Interface trap density of Si/BOX of the control and hardened SOI wafers.
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Comparisons of model size and complexity. FLOPs: the number of
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